Teaching
Selected Talks
“Bayesian Inference on Introduced General Region: An Efficient Parametric Yield Estimation Method for Integrated Circuits”
IEEE/ACM Asia and South Pacific Design Automation Conference (ASPDAC), virtually, 2021
|slides|
“Efficient Performance Trade-off Modeling for Analog Circuit based on Bayesian Neural Network”
IEEE/ACM International Conference on Computer Aided Design (ICCAD), Westminster, CO, USA, Nov. 2019
|slides|
|